Electrical transport measurements

We have several (high-speed) measurement systems available to probe electrical transport of organic electronic devices, as well as their voltage and frequency dependent complex impedance. For transport measurements on organic field effect transistors, a Keithley 4200A-SCS Parameter Analyser is available, allowing voltages of up to ±200V on gate, source and drain terminals and impedance starting at 1 kHz. For optoelectronic device characterization, we have installed a Fluxim PAIOS (Platform for all-in-one Characterization of Solar Cells and (O)LEDs) system, which integrates high-speed transients, electro-optical and impedance measurements at voltages up to ±30V and transients with nanosecond resolution and impedance up to 10 MHz. For very low frequency impedance measurements, a dedicated Solartron 1260A impedance analyzer with dielectric interface allows measurements down to the mHz range, also with high voltage of up to ±40V; higher external voltages can be applied for specific measurements.

 

Most of the setups are mobile and can be connected to either a cryostat, allowing measurements in a temperature range of 70K up to 400K, or the Glovebox-System to measure samples without the need for a vacuum transfer. A thermoelectric cryostat is also available in the Glovebox-System.

 

Fig. 1: Exemplary system for electrical transport measurements using a needle-prober setup in a vacuum chamber with a cooling stage.

Contact person: Dr. Alexander Hofmann

 

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